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Rainer Timm, Olof Persson, David L. J. Engberg, Alexander Fian, James L. Webb, Jesper Wallentin, Andreas Jönsson, Magnus T. Borgström, Lars Samuelson, and Anders Mikkelsen
Current–Voltage Characterization of Individual As-Grown Nanowires Using a Scanning Tunneling Microscope
Nano Lett., 13 (2013) 5182

Abstract
Utilizing semiconductor nanowires for (opto)electronics requires exact knowledge of their current–voltage properties. We report accurate on-top imaging and I–V characterization of individual as-grown nanowires, using a subnanometer resolution scanning tunneling microscope with no need for additional microscopy tools, thus allowing versatile application. We form Ohmic contacts to InP and InAs nanowires without any sample processing, followed by quantitative measurements of diameter dependent I–V properties with a very small spread in measured values compared to standard techniques.

Link to the complete paper (if available):


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